TY - JOUR
T1 - Circuit Topology Approach for the Comparative Analysis of Intrinsically Disordered Proteins
AU - Scalvini, Barbara
AU - Sheikhhassani, Vahid
AU - Brug, Nadine van de
AU - Heling, Laurens W. H. J.
AU - Schmit, Jeremy D.
AU - Mashaghi, Alireza
PY - 2023/4/24
Y1 - 2023/4/24
N2 - Intrinsically disordered proteins (IDPs) lack a stable native conformation, making it challenging to characterize their structure and dynamics. Key topological motifs with fundamental biological relevance are often hidden in the conformational noise, eluding detection. Here, we develop a circuit topology toolbox to extract conformational patterns, critical contacts, and timescales from simulated dynamics of intrinsically disordered proteins. We follow the dynamics of IDPs by providing a smart low-dimensionality representation of their three-dimensional (3D) configuration in the topology space. Such an approach allows us to quantify topological similarity in dynamic systems, therefore providing a pipeline for structural comparison of IDPs.
AB - Intrinsically disordered proteins (IDPs) lack a stable native conformation, making it challenging to characterize their structure and dynamics. Key topological motifs with fundamental biological relevance are often hidden in the conformational noise, eluding detection. Here, we develop a circuit topology toolbox to extract conformational patterns, critical contacts, and timescales from simulated dynamics of intrinsically disordered proteins. We follow the dynamics of IDPs by providing a smart low-dimensionality representation of their three-dimensional (3D) configuration in the topology space. Such an approach allows us to quantify topological similarity in dynamic systems, therefore providing a pipeline for structural comparison of IDPs.
UR - http://dx.doi.org/10.1021/acs.jcim.3c00391
U2 - 10.1021/acs.jcim.3c00391
DO - 10.1021/acs.jcim.3c00391
M3 - Article
SN - 1549-9596
VL - 63
SP - 2586
EP - 2602
JO - Journal of Chemical Information and Modeling
JF - Journal of Chemical Information and Modeling
IS - 8
ER -